Friction Measurements of InAs Nanowires on Silicon Nitride by AFM Manipulation

Abstract

Bent nanowires lying on a planar substrate (see image) have shapes determined by an interplay between internal stresses and friction with the substrate. By analyzing the shapes of InAs nanowires manipulated with an AFM tip, we study quantitatively how static and sliding friction vary with the nanowire diameter. The contact area is truly mesoscopic.