Proceedings of the Royal Society of London A Mathematical and Physical Sciences · 1954 · 37 citations · 5 references
Natural SciencesMaterials EngineeringMaterials ScienceCondensed Matter PhysicsMaterials CharacterizationThin FilmsCrystallographyElectron DiffractionSurface CrystallographyThin Film Mechanical PropertiesThin Film StrainThin-film MaterialsCrystallographic CharacterizationDiffraction AnalysisElectron Diffraction Of Thin FilmsInterplanar SpacingSpacingsSurface Tension ContributionsSurface Tension MeasurementVacuum Evaporation
Abstract Thin films of lithium fluoride and copper prepared by vacuum evaporation have been examined by electron diffraction. From accurate measurements of the interplanar spacings, the stresses in the specimens have been determined. Lithium fluoride specimens consist of long cylinders (diameter ~ 100 Å) having their axes perpendicular to the substrate, there being no fixed relation between the axis of a cylinder and the crystallographic axes, apart from a slight tendency for the [100] crystal axis to lie along the axis of the cylinder. A surface tension of the order of —1000 dyn/cm acts over the surface of each crystal. Copper specimens consist of crystallites in the form of disks (diameter ~ 90 Å, thickness ~ 15Å) parallel to (111) planes. Stresses exist in the specimen due to superficial oxidation of the specimen as a whole, not of the individual crystallites.
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