Electron Diffraction Of Thin Films
Electron Diffraction of Thin Films is a specialized analytical technique within electron diffraction that enables the determination of crystalline structure and orientation in nanoscale thin film materials by interpreting the interference patterns produced by transmitted or reflected electron beams.
356
Publications
16K
Citations
966
Authors
321
Institutions
Publications per year
2017–2026
15
Parents
356
1–5 of 356
966
9
h-index
6
h-index
6
h-index
6
h-index
University at Buffalo, State University of New York, United States
5 publications · 235 citations
5
h-index
1–5 of 966
321
Arizona State University
Tempe, United States
11 h-index
27 publications
1.1K citations

Tohoku University
Sendai, Japan
11 h-index
22 publications
1.1K citations

Imperial College London
London, United Kingdom
9 h-index
17 publications
511 citations
State University of New York
Albany, United States
8 h-index
31 publications
1.4K citations
National Institute of Standards and Technology
Gaithersburg, United States
7 h-index
16 publications
406 citations
Rensselaer Polytechnic Institute
Troy, United States
7 h-index
20 publications
1.2K citations

Roswell Park Comprehensive Cancer Center
Buffalo, United States
7 h-index
7 publications
290 citations
Tokyo Institute of Technology
Tokyo, Japan
7 h-index
20 publications
1.1K citations
1–8 of 321
29 publications · 1.3K citations
20
h-index
PRB · 28 publications · 1.2K citations
19
h-index
19 publications · 913 citations
15
h-index
15 publications · 841 citations
14
h-index
13 publications · 583 citations
13
h-index
1–5