Electron Diffraction Of Thin Films

Electron Diffraction of Thin Films is a specialized analytical technique within electron diffraction that enables the determination of crystalline structure and orientation in nanoscale thin film materials by interpreting the interference patterns produced by transmitted or reflected electron beams.

356

Publications

16K

Citations

966

Authors

321

Institutions

Publications per year

2017–2026

15

Authors

966

  1. FJ
    F. Jona

    State University of New York, United States

    9 publications · 373 citations

    9

    h-index

  2. PM
    P. M. Marcus

    State University of New York, United States

    6 publications · 263 citations

    6

    h-index

  3. SH
    S.W. Hui

    Roswell Park Comprehensive Cancer Center, United States

    6 publications · 279 citations

    6

    h-index

  4. SY
    S. Y. Tong

    University of Wisconsin–Milwaukee, United States

    6 publications · 209 citations

    6

    h-index

  5. JT
    John T. Ho

    University at Buffalo, State University of New York, United States

    5 publications · 235 citations

    5

    h-index

1–5 of 966

Venues

  1. Journal of Applied Physics

    29 publications · 1.3K citations

    20

    h-index

  2. Physical review. B, Condensed matter

    PRB · 28 publications · 1.2K citations

    19

    h-index

  3. Surface Science

    19 publications · 913 citations

    15

    h-index

  4. Applied Physics Letters

    15 publications · 841 citations

    14

    h-index

  5. Ultramicroscopy

    13 publications · 583 citations

    13

    h-index

1–5