2010 · 369 citations · 7 references
EngineeringComputer EngineeringComputer ScienceEmbedded SystemsField-programmable Gate ArraysSystem-on-chip DesignDesign For TestabilityField-programmable Gate Array ArchitecturePhysical Unclonable FunctionsReliable System DesignTiming AnalysisTiming ModelingElectronic Physical Unclonable FunctionsExperimental Data CollectionHamming DistancePhysical Unclonable Function VerificationPhysically Unclonable FunctionsQuality FactorsRing Oscillator Physical Unclonable FunctionsSilicon Physical Unclonable Functions
To validate the effectiveness of a Physical Unclonable Function (PUF), it needs to be characterized over a large population of chips. Though simulation methods can provide approximate results, an on-chip experiment produces more accurate result. In this paper, we characterize a PUF based on ring oscillator (RO) using a significantly large population of 125 FPGAs. We analyze the experimental data using a ring oscillator loop delay model, and quantify the quality factors of a PUF such as uniqueness and reliability. The RO-PUF shows an average inter-die Hamming distance of 47.31%, and an average intra-die Hamming distance of 0.86% at normal operating condition. Additionally, we intend to make this large RO frequency dataset available publicly for the research community.
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