Kan Fu

Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers

Daniel Holcomb, Wayne Burleson, Kan Fu · IEEE Transactions on Computers · 2008 · 823 citations

Engineering, Computer Engineering, Electrical Engineering +15

Ghost Talk: Mitigating EMI Signal Injection Attacks against Analog Sensors

Denis Foo Kune, John Backes, Shane S. Clark et al. · 2013 · 266 citations · Full text

Engineering, Biomedical Engineering, Electrical Engineering +13

Collective topo-epitaxy in the self-assembly of a 3D quantum dot superlattice

Alex Abelson, Caroline Qian, Trenton Salk et al. · Nature Materials · 2019 · 107 citations

Natural Sciences, Materials Science, Physics +14

Terahertz detection in single wall carbon nanotubes

Kan Fu, R. Zannoni, Chak K. Chan et al. · Applied Physics Letters · 2008 · 72 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Dielectrophoretic Assembly of Gold Nanoparticles in Nanoscale Junctions for Rapid, Miniature Chemiresistor Vapor Sensors

Kan Fu, Shutang Chen, Jing Zhao et al. · ACS Sensors · 2016 · 37 citations

Engineering, Chemical Engineering, Materials Science +13