Evaluation of Interfacial Nitrogen Concentration of RTP Oxynitrides by Reoxidation

Yoshio Okada, Philip J. Tobin, Vikas Lakhotia, Sergio A. Ajuria, Rama I. Hegde, Jimmy C. Liao, Peter Rushbrook, Louie J. Arias

Journal of The Electrochemical Society · 1993 · 38 citations · 0 references

Concepts

Abstract

We prepared oxynitrides with different interfacial nitrogen concentration using RTP. Reoxidation kinetics of these oxynitrides was studied. It was found that reoxidation thickness strongly depends on the . The reoxidation kinetics can be used for the evaluation of.