Concepedia

Effects of post-deposition annealing on the structure and optical properties of Y2O3 thin films

X.J. Wang, L.D. Zhang, J.P. Zhang, Gaohang He, M. Liu, L.Q. Zhu

Materials Letters · 2008 · 51 citations · 14 references

DOI

Concepts

References

14

Parameterization of the optical functions of amorphous materials in the interband region

G. E. Jellison, F. A. Modine · Applied Physics Letters · 1996 · 2.3K citations

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Investigations of porous oxides as an antireflective coating for glass surfaces

Bulent E. Yoldas · Applied Optics · 1980 · 307 citations

, , +16

Growth and characterization of Y2O3:Eu3+ phosphor films by sol-gel process

R.P. Rao · Solid State Communications · 1996 · 132 citations

, , +13

Physical and electrical characterization of HfO2 metal–insulator–metal capacitors for Si analog circuit applications

Hang Hu, Chunxiang Zhu, Y. F. Lu et al. · Journal of Applied Physics · 2003 · 108 citations

, , +17

Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon

Şafak Sayan, Nhan V. Nguyen, James R. Ehrstein et al. · Applied Physics Letters · 2005 · 107 citations

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