Journal of Physics D Applied Physics · 2008 · 26 citations · 18 references
Natural SciencesElectrical EngineeringMaterials ScienceMicroelectronicsMicrowave EngineeringThin FilmsDielectric PropertiesDielectric ResponseDielectricsFerroelectric MaterialsMicrowave MaterialsMicrowave Semiconductor DevicesCharacterization Of Microwave MaterialsDielectric CharacterizationHigh-frequency MeasurementMicrowave Dielectric PropertiesParasitic EffectsParasitic ElementsPulsed Laser DepositionThin-film Dielectrics
10.1088/0022-3727/42/1/015501
18