High-energy diffraction microscopy at the advanced photon source

Ulrich Lienert, Shiu Fai Li, Christopher M. Hefferan, Jonathan Lind, Robert M. Suter, Joel V. Bernier, Nathan R. Barton, M.C. Brandes, Michael J. Mills, Matthew P. Miller,

JOM · 2011 · 190 citations · 15 references

Concepts

References

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