Joel V. Bernier

Far-field high-energy diffraction microscopy: a tool for intergranular orientation and strain analysis

Joel V. Bernier, Nathan R. Barton, Ulrich Lienert et al. · The Journal of Strain Analysis for Engineering Design · 2011 · 231 citations

X-ray Crystallography, Intergranular Orientation, Engineering +27

A multiscale strength model for extreme loading conditions

Nathan R. Barton, Joel V. Bernier, Richard Becker et al. · Journal of Applied Physics · 2011 · 188 citations

Engineering, Multiscale Mechanics, Mechanical Engineering +25

High-energy diffraction microscopy at the advanced photon source

Ulrich Lienert, Shiu Fai Li, Christopher M. Hefferan et al. · JOM · 2011 · 187 citations

Photonics, Engineering, Physics +6

Evolution of stress in individual grains and twins in a magnesium alloy aggregate

C. Can Aydıner, Joel V. Bernier, B. Clausen et al. · Physical Review B · 2009 · 173 citations · Full text

Engineering, Severe Plastic Deformation, Mechanical Engineering +17

Investigation of fatigue crack initiation from a non-metallic inclusion via high energy x-ray diffraction microscopy

Diwakar Naragani, Michael D. Sangid, Paul A. Shade et al. · Acta Materialia · 2017 · 128 citations · Full text

Materials Science, Engineering, Microstructure +12