Applied Physics Letters · 1986 · 51 citations · 10 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDopingSemiconductor Device MaterialsSemiconductor PhysicsThermal Properties Of MaterialsThermal Properties Of SemiconductorsWide-bandgap SemiconductorsDoped SemiconductorsDoping StrategiesImpuritiesInsulating MaterialsOptical AbsorptionSemiconductor CharacterizationSemiconductor DopingThermal Stability
Deep levels due to titanium were identified for the first time in InP and GaAs employing capacitance transients and optical absorption measurements. They were found to be Ti4+/Ti3+ donor levels at energies of 0.63±0.03 eV and 1.00±0.03 eV in InP and GaAs, respectively. The near midgap location of this donor level in InP is technologically very significant, since it provides a new means for obtaining semi-insulating InP with a resistivity of about 107 Ω cm. The thermal stability of Ti-doped InP should be superior to that of Fe-doped InP. A formulation involving the Ti dopant and shallow acceptor impurities for obtaining semi-insulating InP from the melt is presented.
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Compensation mechanisms in GaAs
G. M. Martin, J. Farges, Guy Jacob et al. · Journal of Applied Physics · 1980 · 322 citations
Natural Sciences, Electrical Engineering, Materials Science +17
Liquid-phase electroepitaxy: Growth kinetics
L. Jastrzȩbski, J. Łagowski, H. C. Gatos et al. · Journal of Applied Physics · 1978 · 77 citations
The acceptor level of vanadium in III–V compounds
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