Double correlation technique (DDLTS) for the analysis of deep level profiles in semiconductors

Statistics of the Recombinations of Holes and Electrons

W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations

Engineering, Electrical Engineering, Recombination +15

Deep impurities in semiconductors

J. Llacer · Journal of Crystal Growth · 1974 · 785 citations

Engineering, Materials Science, Physics +12

Gallium Arsenide and Related Compounds

Bob Wilson · Physics Bulletin · 1973 · 694 citations

Natural Sciences, Chemistry, Physics +10

Fast capacitance transient appartus: Application to ZnO and O centers in GaP <i>p-n</i> junctions

D. V. Lang · Journal of Applied Physics · 1974 · 604 citations

Engineering, Materials Engineering, Materials Science +17

The Poole-Frenkel Effect with Compensation Present

J.R. Yeargan, Howard L. Taylor · Journal of Applied Physics · 1968 · 432 citations

Engineering, Materials Engineering, Materials Science +15