ACS Applied Materials & Interfaces · 2014 · 19 citations · 33 references
EngineeringBioengineeringMicrobiologyNanobiotechnologyNanomaterialsNanotechnologyAtomic Force MicroscopyNanostructured BiomaterialsAnchoringAtomic Force Microscopy AnalysisChainsDirected Self-assemblyMicrocontact PrintingNanofabricationNoncontact Atomic Force MicroscopyPatterns
Immobilization of living micro-organisms on predefined areas of substrates is a prerequisite for their characterizations by atomic force microscopy (AFM) in culture media. It remains challenging since micro-organisms should not be denatured but attached strongly enough to be scanned with an AFM tip, in a liquid phase. In this work, a novel approach is proposed to electrostatically assemble biological objects of interest on 2 nm thick polyethylenimine (PEI) patterns fabricated by nanoxerography. This nanoxerography process involves electrostatic trapping of PEI chains on negatively charged patterns written on electret thin films by AFM or electrical microcontact printing. The capability of this approach is demonstrated using a common biological system, Pseudomonas aeruginosa bacteria. These negatively charged bacteria are selectively assembled on large scale arrays of PEI patterns. In contrast to other PEI continuous films commonly used for cell anchoring, these ultrathin PEI patterns strongly attached on the surface do not cause any denaturation of the assembled Pseudomonas aeruginosa bacteria. AFM characterizations of large populations of individual living bacteria in culture media can thus be easily performed through this approach, providing the opportunity to perform representative statistical data analysis. Interestingly, this process may be extended to any negatively charged micro-organism in solution.
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A two-stage poly(ethylenimine)-mediated cytotoxicity: implications for gene transfer/therapy
S. Moein Moghimi, Peter Symonds, J. Clifford Murray et al. · Molecular Therapy · 2005 · 1.1K citations · Full text
Pharmacy, Pharmacology, Toxicology +17
Resolution and contrast in Kelvin probe force microscopy
Heiko O. Jacobs, P. Leuchtmann, O.J. Homan et al. · Journal of Applied Physics · 1998 · 469 citations