Nuclear microanalysis using MeV carbon ion backscattering; usefulness and applications

Analysis of amorphous layers on silicon by backscattering and channeling effect measurements

O. Meyer, J. Gyulai, J. W. Mayer · Surface Science · 1970 · 90 citations

Electrical Engineering, Amorphous Layers, Effect Measurements +7

Channeling in Iron and Lattice Location of Implanted Xenon

L. C. Feldman, D. E. Murnick · Physical review. B, Solid state · 1972 · 56 citations

Engineering, Nuclear Physics, Radiation Exposure +18

Critical angles for channeling of low energy ions in tungsten

I. Bergström, K. Björkqvist, Bengt Domeij et al. · Canadian Journal of Physics · 1968 · 39 citations

X-ray Crystallography, Tungsten Single Crystal, Engineering +18

THE DETERMINATION OF SURFACE CONTAMINATION ON SILICON BY LARGE ANGLE ION SCATTERING

D. A. Thompson, H. D. Barber, William D. Mackintosh · Applied Physics Letters · 1969 · 33 citations

Engineering, Energy Spectra, Chemistry +17

Lattice-Location Studies on Tl, Pb, and Bi in Iron, and the Hyperfine Field at Pb in Iron

L. C. Feldman, E. N. Kaufmann, D.W. Mingay et al. · Physical Review Letters · 1971 · 32 citations

Engineering, Magnetic Resonance, Channeling Technique +18