Functional Testing of Current Microprocessors (applied to the Intel i860)

Abstract

In the early 1980's a method has been developed for functional testing of microprocessors (1-31. Current microprocessors have a functionul- ity, such as on-chip caches, which is not covered by the model of (I-31. This paper extends that functional model and proposes fault models togeth- er with tests for such microprocessors. The pro- posed concepts and algorithms have been applied to the i860 and show to be very effective, since faults were found which where not found by tradi- tional functional tests.