Burn-in elimination of a high volume microprocessor using I/sub DDQ/

Abstract

For many years at this conference and others, I/sup DDQ/ has been a subject of much controversy involving its ability to enhance production test. While standard industry methods such as stuck-at functional testing and scan based testing are largely accepted by the global test community, I/sub DDQ/ testing continues to spark debate in the industry. This paper shows that I/sub DDQ/ testing is not only beneficial to production test, but also enabled the i960/sup R/JX Microprocessor to ZOBI the standard production flow. ZOBI is an internal Intel term meaning 'Zero Hour Burn In' which will be explained further in a later section. This paper details the methodology employed for I/sub DDQ/ vector selection, tester manipulation, program flow, limits selection, and production qualification. The effect of I/sub DDQ/ on burn-in elimination and outgoing quality is demonstrated.