Repository for Publications and Research Data (ETH Zurich) · 2006 · 175 citations · 3 references
EngineeringRobotics EngineeringDigital ImagingMachine VisionSensorsCalibrationCamera GeometryImage SensorsPhotogrammetrySensor CalibrationSpatial CalibrationCamera CalibrationDepth CalibrationDistance CalibrationDistance Scale CalibrationImage Sensor CalibrationRange SensingRange Sensor CalibrationSystem Calibration
Range imaging is a promising technology for measurement and modeling, yet its recent market emergence and limited implementations mean that its millimetre‑level accuracy—required in robotics and measurement systems—is not yet achieved by raw data. The study aims to identify key parameters affecting the SwissRanger camera’s performance and to introduce a parameter‑based calibration strategy. Calibration is performed by applying photogrammetric camera calibration and a distance‑system calibration that accounts for reflectivity and distance effects.
Range imaging is a new suitable choice for measurement and modeling in many different applications. But due to the technology’s relatively new appearance on the market with a few different realizations, the knowledge of its capabilities is very low. In most applications, like robotics and measurement systems, the accuracy wanted, lies at some millimeters. The raw data of range imaging cameras do not reach this level. Therefore, the calibration of the sensors output is needed. In this paper some of the parameters which influence the behavior and performance of the range imaging camera SwissRanger (provided by the Swiss Center for Electronics and Microtechnology CSEM) are described. Because of the highly systematic structure and correlations between parameters and output data, a parameter based calibration approach is presented. This includes a photogrammetric camera calibration and a distance system calibration with respect to the reflectivity and the distance itself.
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Thierry Oggier, Michael Lehmann, R. Kaufmann et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 236 citations