Publication | Closed Access
Device SEE susceptibility from heavy ions (1995-1996)
19
Citations
14
References
2002
Year
Unknown Venue
Electrical EngineeringSeventh SetEngineeringPhysicsNatural SciencesParticle PhysicsApplied PhysicsSingle Event EffectsCosmic RayElectrophysiologyIon BeamTest DataInstrumentationDevice See SusceptibilityIon EmissionIon ProcessSeveral Functional Classes
A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs.
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