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Photoinduced insulator–metal transition in La0.81MnO3/Al2O3/Nb tunnel junctions
15
Citations
9
References
2001
Year
Optical MaterialsVisible LightEngineeringPhotoinduced Insulator–metal TransitionTunnel JunctionsOptoelectronic DevicesLa0.81mno3/al2o3/nb Tunnel JunctionsSemiconductorsElectronic DevicesTunneling MicroscopyQuantum MaterialsOxide HeterostructuresSemiconductor TechnologyElectrical EngineeringPhysicsOxide ElectronicsSemiconductor MaterialApplied PhysicsCondensed Matter PhysicsThin FilmsOptoelectronics
We report the effect of illumination by ultraviolet and visible light on the resistance versus temperature and current versus voltage characteristics of La0.81MnO3/Al2O3/Nb tunnel junctions. Under illumination, the resistance of tunnel junctions follows the resistance in darkness at high temperatures but at temperatures lower than 95 K, the illumination induces a colossal decrease of the resistance. This is a transient effect because the changes are reversible when the light is switched on and off. Changes of the electrical properties under illumination were seen for the tunnel junctions only and not in the epitaxial La0.81MnO3 electrode which shows a classical insulator–metal transition at temperature Tc=285 K. We explain this effect by a photoinduced insulator–metal transition of the oxygen depleted manganite interface close to the tunnel barrier which changes dramatically the width of the barrier.
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