Impact of the device scaling on the low-frequency noise in n-MOSFETs - Concepedia

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Impact of the device scaling on the low-frequency noise in n-MOSFETs

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0

References

2000

Year

H. Bu, Yi Shi, Xueliang Yuan, Yi Zheng, Siyu Gu, H. Majima, Hiroki Ishikuro, Toshiro Hiramoto

Applied Physics A

Low-power ElectronicsElectrical EngineeringEngineeringTechnology ScalingNanoelectronicsElectronic EngineeringBias Temperature InstabilityApplied PhysicsNoiseLow-frequency NoiseMicroelectronics

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