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Si-doped AlxGa1−xN(0.56⩽×⩽1) layers grown by molecular beam epitaxy with ammonia
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2005
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Materials ScienceSemiconductorsMaterials EngineeringX-ray CrystallographyEngineeringCrystal StructurePhysicsAluminium NitrideNatural SciencesEpitaxial GrowthApplied PhysicsCondensed Matter PhysicsOptoelectronic DevicesMolecular Beam EpitaxySeptember 2005Si-doped Alxga1−xnCrystal Structure Design
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation B. Borisov, V. Kuryatkov, Yu. Kudryavtsev, R. Asomoza, S. Nikishin, D. Y. Song, M. Holtz, H. Temkin; Si-doped AlxGa1−xN(0.56⩽×⩽1) layers grown by molecular beam epitaxy with ammonia. Appl. Phys. Lett. 26 September 2005; 87 (13): 132106. https://doi.org/10.1063/1.2061856 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search
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