1988 · 211 citations · 6 references
Natural SciencesMaterials EngineeringMaterials ScienceInterface ScienceSurface ChemistrySurface ScienceInterface EngineeringInterface PhysicsSemiconductor InterfacesSemiconductor SurfacesSilicon MaterialsSurface PhysicsInterface FormationSiliconSilicon DioxideSilicon InterfacesSilicon Surface Science
6
Characteristic electronic defects at the Si-SiO2 interface
N. M. Johnson, D. K. Biegelsen, M. D. Moyer et al. · Applied Physics Letters · 1983 · 187 citations
The structural models of the Si/SiO2 interface
Iwao Ohdomari, H. Akatsu, Yukio Yamakoshi et al. · Journal of Non-Crystalline Solids · 1987 · 62 citations