Concepedia

Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation1This work is dedicated to Professor Dr Guenther Schoeck on the occasion of his 70th birthday.1

M. Zehetbauer, T. Ungár, Róbert Král, A. Borbély, Erhard Schafler, Balder Ortner, Heinz Amenitsch, Sigrid Bernstorff

Acta Materialia · 1999 · 53 citations · 23 references

DOI

Concepts

References

23

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