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Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation1This work is dedicated to Professor Dr Guenther Schoeck on the occasion of his 70th birthday.1
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1999
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X-ray CrystallographyMaterials ScienceEngineeringPhysicsCrystalline DefectsNatural SciencesSynchrotron Radiation1this WorkApplied PhysicsX-ray DiffractionCrystallographySynchrotron Radiation SourceMicrostructureStructural Materials
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