Impact of on-chip process variations performance on MCML [MOS current mode logic]

S. Bruma

2004 · 27 citations · 9 references

Concepts

Abstract

The effect of on-chip process variations on MOS current mode logic (MCML) performance is explored. A closed form expression for the noise-margin is derived. On-chip process variations are shown to set the lower limit for the power dissipation of an MCML family.

References

9