Publication | Closed Access
CAEN-BIST: testing the nanofabric
46
Citations
34
References
2005
Year
Unknown Venue
EngineeringChemically-assembled Electronic NanotechnologyDefect ToleranceRegular ArchitecturesNanoelectronicsNanometrologyElectronic PackagingNanoscale ScienceNanotechnologyComputer EngineeringBuilt-in Self-testMicroelectronicsDesign For TestingHigh Defect DensitiesSilicon DebuggingNanomaterialsSoftware TestingApplied PhysicsNanoreactorNanofabricationFault Injection
A built-in self-test algorithm is developed for chemically-assembled electronic nanotechnology (CAEN) that exploits reconfigurability to achieve 100% fault coverage and nearly 100% diagnostic accuracy. This algorithm is particularly suited for regular architectures with high defect densities.
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