Applied Physics Letters · 1971 · 62 citations · 11 references
EngineeringMaterials EngineeringMaterials ScienceInterface ScienceSemiconductor MaterialsSurface ScienceDopingInterface EngineeringSemiconductor InterfacesSilicon MaterialsSilicide ContactsSilicon ContaminationSilicon DioxideSilicon InterfacesSodium Content
Scanning internal photoemission has been used to map barrier inhomogeneities in a sodium-contaminated Si–SiO2 interface. The interface barrier is lowered in local regions at which sodium accumulates.
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