2015 · 31 citations · 14 references
EngineeringComputer EngineeringElectrical EngineeringComputer SecurityEmbedded SystemsHardware SecurityBuilt-in Self-testDesign For TestabilityEmbedded SecurityEmbedded System SecurityHardware DebuggingHardware ObfuscationDenial Of ServiceEncryptionHardware Security ArchitectureHardware Security Reverse EngineeringLogic Built-in Self-testMicroprocessor Built-in Self-testMonitorsUnauthorized Access Detection
Today's chips often contain a wealth of embedded instruments, including sensors, hardware monitors, built-in self-test (BIST) engines, etc. They may process sensitive data that requires encryption or obfuscation and may contain encryption keys and ChipIDs. Unfortunately, unauthorized access to internal registers or instruments through test and debug circuitry can turn design for testability (DFT) logic into a backdoor for data theft, reverse engineering, counterfeiting, and denial-of-service attacks. A compromised chip also poses a security threat to any board or system that includes that chip, and boards have their own security issues. We will provide an overview of some chip and board security concerns as they relate to DFT hardware and will briefly review several ways in which the new IEEE 1687 standard can be made more secure. We will then discuss the need for an IEEE Security Standard that can provide solutions and metrics for providing appropriate security matched to the needs of a real world environment.
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On the vulnerability of FPGA bitstream encryption against power analysis attacks
Amir Moradi, Alessandro Barenghi, Timo Kasper et al. · 2011 · 201 citations
Securing Scan Design Using Lock and Key Technique
J. Lee, Mark Tehranipoor, Chintan Patel et al. · 2006 · 95 citations
Don't forget to lock your SIB: hiding instruments using P1687
Jennifer Dworak, Al Crouch, John R. Potter et al. · 2013 · 72 citations