A 3-Transistor DRAM Cell with Gated Diode for Enhanced Speed and Retention Time

Abstract

3T1D is a non-destructive read DRAM cell with three transistors (T) and a gated diode (D). The gated diode acts as a storage device and an amplifier, leading to low voltage, high speed and high tolerance to variability, and comparing favorably to conventional 3T gain cell and 6T SRAM cell. Hardware measurements in 90 nm SOI showed the 3T1D achieved longer retention than the 3T. Retention, speed and scaling perspectives for future technology are presented