Publication | Open Access

Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops

Process VariationsFinfet Flip-flopsElectrical EngineeringEngineeringHardware ReliabilityBias Temperature InstabilityCircuit ReliabilitySemiconductor MemoryElectronic PackagingWrite FailuresMicroelectronicsDevice Reliability