Publication | Closed Access
Impact of pattern dependency of SiGe layers grown selectively in source/drain on the performance of 14nm node FinFETs
23
Citations
17
References
2016
Year
Electrical EngineeringSige LayersEngineeringVlsi DesignNanoelectronicsApplied PhysicsSemiconductor Device FabricationPattern DependencySilicon On InsulatorMicroelectronicsNode FinfetsSemiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1