Transient Disturbance Testing

Transient Disturbance Testing is a methodological framework within electromagnetic compatibility validation that systematically assesses the resilience of electronic systems to short-duration, high-amplitude electromagnetic transients by exposing them to standardized transient waveforms under controlled laboratory conditions.

23

Publications

677

Citations

69

Authors

27

Institutions

Publications per year

2017–2026

4

Authors

69

  1. YL
    Yuchen Lu

    University of California San Diego, United States

    2 publications · 46 citations

    2

    h-index

  2. EK
    E. Krizauskas

    Siemens Healthcare (United States), United States

    2 publications · 46 citations

    2

    h-index

  3. LM
    Laurie Martuscello

    Siemens Healthcare (United States), United States

    2 publications · 46 citations

    2

    h-index

  4. XC
    Xiang Cui

    North China Electric Power University, China

    2 publications · 63 citations

    2

    h-index

  5. CJ
    Chongqing Jiao

    North China Electric Power University, China

    2 publications · 63 citations

    2

    h-index

1–5 of 69

Venues

  1. 4

    h-index

  2. 2

    h-index

  3. IEEE Transactions on Power Delivery

    2 publications · 71 citations

    2

    h-index

  4. 2

    h-index

  5. 1

    h-index

1–5