Concepedia

Scattering Parameter Characterization

Scattering Parameter Characterization is a measurement and analysis framework used in microwave and RF engineering that distinguishes itself by quantifying the linear response of a MEMS resonator to incident and reflected electromagnetic waves through frequency-dependent scattering parameters, enabling the extraction of device performance metrics such as resonance frequency, quality factor, and impedance matching.

188

Publications

5.7K

Citations

520

Authors

223

Institutions

Publications per year

2017–2026

43

Parents

Publications

188

A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits

W.L. Ko, R. Mittra · IEEE Transactions on Microwave Theory and Techniques · 1991 · 156 citations

, , +16

Experimental retrieval of the effective parameters of metamaterials based on a waveguide method

Hongsheng Chen, Jingjing Zhang, Yang Bai et al. · Optics Express · 2006 · 152 citations · Full text

, , +17

Mixed-mode S-parameter characterization of differential structures

Wenhui Fan, A.C.W. Lu, L.L. Wai et al. · 2004 · 149 citations

, , +16

Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits

D.E. Bockelman, W.R. Eisenstadt · IEEE Transactions on Microwave Theory and Techniques · 1997 · 147 citations

, , +16

2Wideband Reference-Plane Invariant Method for Measuring Electromagnetic Parameters of Materials

K. Sarvala · 2016 · 133 citations

, , +17

1–5 of 188

Authors

520

  1. UC
    Uğur Cem Hasar

    Atatürk University, Türkiye

    11 publications · 281 citations

    11

    h-index

  2. DF
    Dylan F. Williams

    National Institute of Standards and Technology, United States

    6 publications · 148 citations

    6

    h-index

  3. RB
    Roger B. Marks

    National Institute of Standards and Technology, United States

    4 publications · 117 citations

    4

    h-index

  4. RC
    Roland Clarke

    University of Leeds, United Kingdom

    4 publications · 80 citations

    4

    h-index

  5. JJ
    Joaquim J. Barroso

    Instituto Nacional de Pesquisas Espaciais, Brazil

    4 publications · 57 citations

    4

    h-index

1–5 of 520

Institutions

223

  1. National Institute of Standards and Technology

    Gaithersburg, United States

    13 h-index

    23 publications

    624 citations

  2. Atatürk University

    Erzurum, Türkiye

    8 h-index

    15 publications

    304 citations

  3. Gaziantep University

    Gaziantep, Türkiye

    7 h-index

    11 publications

    193 citations

  4. University of Leeds

    Leeds, United Kingdom

    6 h-index

    12 publications

    379 citations

  5. Centre National de la Recherche Scientifique

    Paris, France

    5 h-index

    15 publications

    253 citations

  6. Instituto Nacional de Pesquisas Espaciais

    São José dos Campos, Brazil

    4 h-index

    4 publications

    57 citations

  7. National Physical Laboratory

    London, United Kingdom

    4 h-index

    10 publications

    190 citations

  8. Motorola (United States)

    Schaumburg, United States

    3 h-index

    4 publications

    262 citations

1–8 of 223

Venues

  1. 25

    h-index

  2. 12

    h-index

  3. Review of Scientific Instruments

    4 publications · 47 citations

    4

    h-index

  4. 3

    h-index

  5. IEEE Sensors Journal

    3 publications · 125 citations

    3

    h-index

1–5