A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits

Abstract

It is demonstrated that in applying the FD-TD technique to analyze microwave integrated circuits, the long FD-TD time record required for generating accurate frequency domain scattering parameters can be extrapolated from a relatively short FD-TD time record by using Prony's method. As shown by comparison with the direct FD-TD generated results, the approach using the combination of FD-TD and Prony's methods achieves the same type of accuracy with a time record computed over a much shorter time.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>