Concepedia

Reliability Growth Testing

Reliability Growth Testing is a reliability validation method that systematically identifies, analyzes, and corrects design deficiencies during development to demonstrate improvement in system reliability over time through iterative testing and corrective actions.

34

Publications

793

Citations

81

Authors

43

Institutions

Publications per year

2017–2026

4

Parents

Publications

34

Reliability for Technology, Engineering, and Management

Gordon Johnston, P. A. Kales · Technometrics · 2000 · 59 citations

, , +17

A simple goodness-of-fit test for the power-law process, based on the duane plot

Olivier Gaudoin, Bo Yang, Min Xie · IEEE Transactions on Reliability · 2003 · 51 citations

, , +16

Development and Reliability Testing of a Food Store Observation Form

Leah Rimkus, Lisa M. Powell, Shannon N. Zenk et al. · Journal of Nutrition Education and Behavior · 2013 · 51 citations

, , +9

A Bayesian Note on Reliability Growth During a Development Testing Program

A.F.M. Smith · IEEE Transactions on Reliability · 1977 · 39 citations

, , +16

Economic allocation of test times for subsystem-level reliability growth testing

David W. Coit · IIE Transactions · 1998 · 37 citations

, , +14

1–5 of 34

Authors

81

  1. LH
    Larry H. Crow

    AT&T (United States), United States

    4 publications · 71 citations

    4

    h-index

  2. LW
    Lesley Walls

    University of Strathclyde, United Kingdom

    2 publications · 48 citations

    2

    h-index

  3. OG
    Olivier Gaudoin

    Université Grenoble Alpes, France

    2 publications · 84 citations

    2

    h-index

  4. MX
    Min Xie

    National University of Singapore, Singapore

    2 publications · 69 citations

    2

    h-index

  5. JQ
    John Quigley

    University of Strathclyde, United Kingdom

    2 publications · 48 citations

    2

    h-index

1–5 of 81

Institutions

43

  1. AT&T (United States)

    Bedminster, United States

    2 h-index

    2 publications

    34 citations

  2. University of Strathclyde

    Glasgow, United Kingdom

    2 h-index

    4 publications

    96 citations

  3. National University of Singapore

    Singapore, Singapore

    2 h-index

    2 publications

    38 citations

  4. Chinese Academy of Sciences

    Beijing, China

    1 h-index

    3 publications

    78 citations

  5. Madison Group (United States)

    Madison, United States

    1 h-index

    1 publications

    23 citations

  6. Arizona State University

    Tempe, United States

    1 h-index

    1 publications

    51 citations

  7. Shanghai University

    Shanghai, China

    1 h-index

    1 publications

    20 citations

  8. HRL Laboratories (United States)

    Malibu, United States

    1 h-index

    2 publications

    66 citations

1–8 of 43

Venues

  1. IEEE Transactions on Reliability

    4 publications · 150 citations

    4

    h-index

  2. 3

    h-index

  3. Microelectronics Reliability

    2 publications · 31 citations

    2

    h-index

  4. Reliability Engineering & System Safety

    2 publications · 53 citations

    2

    h-index

  5. IIE Transactions

    2 publications · 50 citations

    2

    h-index

1–5