Quantification Of Surface Coverage

Quantification of Surface Coverage is a metric in surface science that, within the framework of X-Ray Photoelectron Spectroscopy, differentiates itself from related analytical measures by enabling the precise determination of the fractional area occupied by a specific chemical species on a material's surface through the correlation of photoelectron intensities with elemental concentrations and atomic sensitivity factors.

70

Publications

4.7K

Citations

225

Authors

82

Institutions

Publications per year

2017–2026

5

Authors

225

  1. PN
    P.R. Norton

    Western University, Canada

    3 publications · 274 citations

    3

    h-index

  2. JD
    John Davies

    Atomic Energy (Canada), Canada

    3 publications · 274 citations

    3

    h-index

  3. DY
    Dmitri Y. Petrovykh

    International Iberian Nanotechnology Laboratory, Portugal

    2 publications · 235 citations

    2

    h-index

  4. WL
    W.N. Lennard

    Western University, Canada

    2 publications · 36 citations

    2

    h-index

  5. HH
    Hidde H. Brongersma

    Eindhoven University of Technology, Netherlands

    2 publications · 33 citations

    2

    h-index

1–5 of 225

Venues

  1. Surface Science

    8 publications · 457 citations

    8

    h-index

  2. The Journal of Physical Chemistry

    5 publications · 455 citations

    5

    h-index

  3. 4

    h-index

  4. Langmuir

    3 publications · 271 citations

    3

    h-index

  5. Physical review. B, Condensed matter

    PRB · 3 publications · 78 citations

    3

    h-index

1–5