Processing-induced Defects
Processing-Induced Defects is a quality disorder characterized by physical, chemical, or structural alterations in a material or product that arise specifically from manufacturing, thermal, mechanical, or chemical processing conditions, distinguishing it from inherent or design-related defects.
132
Publications
7.9K
Citations
622
Authors
246
Institutions
Publications per year
2017–2026
40
Parents
132
DHX9 suppresses RNA processing defects originating from the Alu invasion of the human genome
Tuğçe Aktaş, Daniel Maticzka, Vivek Bhardwaj et al. · Nature · 2017 · 656 citations
Realistic fault modeling for VLSI testing
W. Maly · 1987 · 241 citations
Engineering, Computer Engineering, Electrical Engineering +14
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246

Centre National de la Recherche Scientifique
Paris, France
5 h-index
28 publications
1.1K citations
Carnegie Mellon University
Pittsburgh, United States
4 h-index
8 publications
771 citations

Pennsylvania State University
State College, United States
4 h-index
15 publications
483 citations
University of Delaware
Newark, United States
3 h-index
10 publications
419 citations

Oak Ridge National Laboratory
Oak Ridge, United States
3 h-index
12 publications
12.6K citations
KU Leuven
Leuven, Belgium
3 h-index
9 publications
342 citations
NTT (Japan)
Tokyo, Japan
3 h-index
8 publications
132 citations
Rutgers, The State University of New Jersey
New Brunswick, United States
2 h-index
8 publications
278 citations
1–8 of 246
MSF · Book series · 5 publications · 94 citations
5
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5 publications · 94 citations
5
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4 publications · 272 citations
4
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4 publications · 83 citations
4
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AAC · 3 publications · 166 citations
3
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1–5