Concepedia

Oscillation-based Testing

Oscillation-Based Testing is a built-in self-test methodology in which the fault detection of analog and mixed-signal circuits is achieved by converting the circuit under test into an oscillator and analyzing the resulting oscillation frequency as a signature for deviation from expected behavior.

64

Publications

2.1K

Citations

121

Authors

56

Institutions

Publications per year

2017–2026

7

Variants

Obt

Parents

Publications

64

Oscillation-test strategy for analog and mixed-signal integrated circuits

K. Arabi, Bożena Kamińska · 2002 · 170 citations

, , +15

Testing analog and mixed-signal integrated circuits using oscillation-test method

K. Arabi, Bożena Kamińska · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1997 · 157 citations

, , +16

Oscillation-test methodology for low-cost testing of active analog filters

K. Arabi, Bożena Kamińska · IEEE Transactions on Instrumentation and Measurement · 1999 · 138 citations

, , +16

Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits

K. Arabi, Bożena Kamińska · 2002 · 129 citations

, , +17

Efficient and accurate testing of analog-to-digital converters using oscillation-test method

K. Arabi, Bożena Kamińska · 1997 · 82 citations

, , +13

1–5 of 64

Authors

121

  1. GH
    Gloria Huertas

    Instituto de Microelectrónica de Sevilla, Spain

    12 publications · 396 citations

    11

    h-index

  2. BK
    Bożena Kamińska

    Instytut Biologii Doświadczalnej im. Marcelego Nenckiego, Poland

    10 publications · 871 citations

    10

    h-index

  3. KA
    K. Arabi

    Polytechnique Montréal, Canada

    9 publications · 800 citations

    9

    h-index

  4. AR
    A. Rueda

    Instituto de Microelectrónica de Sevilla, Spain

    8 publications · 300 citations

    8

    h-index

  5. DV
    D. Vázquez

    Instituto de Microelectrónica de Sevilla, Spain

    8 publications · 290 citations

    8

    h-index

1–5 of 121

Institutions

56

  1. Instituto de Microelectrónica de Sevilla

    Seville, Spain

    13 h-index

    57 publications

    1.9K citations

  2. Universidad de Sevilla

    Seville, Spain

    10 h-index

    46 publications

    1.1K citations

  3. Jožef Stefan Institute

    Ljubljana, Slovenia

    5 h-index

    10 publications

    166 citations

  4. Polytechnique Montréal

    Montreal, Canada

    5 h-index

    10 publications

    947 citations

  5. Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier

    Montpellier, France

    5 h-index

    5 publications

    97 citations

  6. Georgia Institute of Technology

    Atlanta, United States

    4 h-index

    12 publications

    360 citations

  7. Universidade Federal do Rio Grande do Sul

    Porto Alegre, Brazil

    4 h-index

    13 publications

    196 citations

  8. National University of Villa María

    Villa María, Argentina

    3 h-index

    7 publications

    102 citations

1–8 of 56

Venues

  1. Journal of Electronic Testing

    JETTA · 5 publications · 71 citations

    5

    h-index

  2. 3

    h-index

  3. Microelectronics Journal

    3 publications · 66 citations

    3

    h-index

  4. Sensors

    2 publications · 27 citations

    2

    h-index

  5. IEEE Design & Test of Computers

    2 publications · 137 citations

    2

    h-index

1–5