Orchard Yield Mapping

Orchard Yield Mapping is a specialized form of agricultural spatial analysis that generates georeferenced visual representations of crop yield variability within orchard systems by integrating sensor-based harvest data with precise location information to support precision orchard management decisions.

16

Publications

1K

Citations

69

Authors

29

Institutions

Publications per year

2017–2026

7

Authors

69

  1. CW
    Chenglin Wang

    South China Agricultural University, China

    2 publications · 73 citations

    2

    h-index

  2. VI
    Volkan Isler

    University of Minnesota, United States

    2 publications · 193 citations

    2

    h-index

  3. JU
    James Underwood

    The University of Sydney, Australia

    2 publications · 459 citations

    2

    h-index

  4. PR
    Pravakar Roy

    University of Minnesota, United States

    2 publications · 193 citations

    2

    h-index

  5. SF
    S. Fountas

    University of Thessaly, Greece

    2 publications · 127 citations

    2

    h-index

1–5 of 69

Venues

  1. Precision Agriculture

    3 publications · 163 citations

    3

    h-index

  2. Frontiers in Plant Science

    1 publications · 30 citations

    1

    h-index

  3. Revista Brasileira de Fruticultura

    1 publications · 20 citations

    1

    h-index

  4. Journal of Field Robotics

    JFR · 1 publications · 174 citations

    1

    h-index

  5. Transactions of the ASABE

    1 publications · 11 citations

    1

    h-index

1–5