Concepedia

Length Traceability

Length Traceability is a metrological framework that establishes an unbroken chain of calibrations linking a given length measurement to a primary standard, typically the International System of Units (SI) definition of the metre, through documented and legally recognized reference points.

6

Publications

226

Citations

17

Authors

6

Institutions

Publications per year

2017–2026

1

Parents

Publications

6

Uncertainty in pitch measurements of one-dimensional grating standards using a nanometrological atomic force microscope

Ichiko Misumi, Satoshi Gonda, Tomizo Kurosawa et al. · Measurement Science and Technology · 2003 · 109 citations

, , +16

Measurement of length, surface form and thermal expansion coefficient of length bars up to 1.5 m using multiple-wavelength phase-stepping interferometry

Andrew Lewis · Measurement Science and Technology · 1994 · 40 citations

, , +17

The lattice parameter of silicon: a secondary realisation of the metre

Andrew Yacoot, Harald Bosse, R. G. Dixson · Measurement Science and Technology · 2020 · 33 citations

, , +17

Novel Principle of Contactless Gauge Block Calibration

Zdeněk Buchta, Šimon Řeřucha, Břetislav Mikel et al. · Sensors · 2012 · 20 citations · Full text

, , +16

Theoretical Analysis of Length Measurement Using Interference of Multiple Pulse Trains of a Femtosecond Optical Frequency Comb

Dong Wei, Satoru Takahashi, Kiyoshi Takamasu et al. · Japanese Journal of Applied Physics · 2011 · 13 citations

, , +16

1–5 of 6

Authors

17

  1. KT
    Kiyoshi Takamasu

    The University of Tokyo, Japan

    2 publications · 122 citations

    2

    h-index

  2. IM
    Ichiko Misumi

    National Institute of Advanced Industrial Science and Technology, Japan

    1 publications · 109 citations

    1

    h-index

  3. SG
    Satoshi Gonda

    National Institute of Advanced Industrial Science and Technology, Japan

    1 publications · 109 citations

    1

    h-index

  4. HM
    Hirokazu Matsumoto

    The University of Tokyo, Japan

    1 publications · 13 citations

    1

    h-index

  5. BM
    Břetislav Mikel

    Czech Academy of Sciences, Institute of Scientific Instruments, Czechia

    1 publications · 20 citations

    1

    h-index

1–5 of 17

Institutions

6

  1. National Institute of Standards and Technology

    Gaithersburg, United States

    2 h-index

    2 publications

    44 citations

  2. The University of Tokyo

    Tokyo, Japan

    2 h-index

    6 publications

    270 citations

  3. National Physical Laboratory

    London, United Kingdom

    2 h-index

    2 publications

    73 citations

  4. Czech Academy of Sciences, Institute of Scientific Instruments

    Brno, Czechia

    1 h-index

    5 publications

    100 citations

  5. Physikalisch-Technische Bundesanstalt

    Braunschweig, Germany

    1 h-index

    1 publications

    33 citations

  6. National Institute of Advanced Industrial Science and Technology

    Tsukuba, Japan

    1 h-index

    3 publications

    327 citations

1–6 of 6

Venues

  1. Measurement Science and Technology

    3 publications · 182 citations

    3

    h-index

  2. 1

    h-index

  3. Sensors

    1 publications · 20 citations

    1

    h-index

  4. Japanese Journal of Applied Physics

    JJAP · 1 publications · 13 citations

    1

    h-index

1–4