Jtag Test Access
JTAG Test Access is a standardized hardware-level interface mechanism that enables direct access to integrated circuits for testing, debugging, and programming purposes through a serial communication protocol defined by the IEEE 1149.1 standard.
20
Publications
516
Citations
57
Authors
31
Institutions
Publications per year
2017–2026
3
Variants
Ieee 1149.1Joint Test Action Group Test Access
Parents
20
Design automation for IEEE P1687
Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson et al. · 2011 · 64 citations
IJTAG (Internal JTAG): A Step Toward a DFT Standard
Jeff Rearick, Bill Eklow, K. Posse et al. · 2006 · 53 citations
Engineering, Computer Engineering, Electrical Engineering +15
1–5 of 20
57
3
h-index
3
h-index
2
h-index
2
h-index
2
h-index
1–5 of 57
31

Linköping University
Linköping, Sweden
3 h-index
6 publications
249 citations
Philips (Netherlands)
Amsterdam, The Netherlands
2 h-index
4 publications
41 citations

Southern Illinois University Carbondale
Carbondale, United States
2 h-index
4 publications
104 citations

Lund University
Lund, Sweden
2 h-index
3 publications
57 citations
Ericsson (Sweden)
Kista, Sweden
2 h-index
3 publications
110 citations
Case Western Reserve University
Cleveland, United States
2 h-index
4 publications
204 citations

Universidade do Porto
Porto, Portugal
2 h-index
3 publications
37 citations
Carnegie Mellon University
Pittsburgh, United States
2 h-index
4 publications
50 citations
1–8 of 31
1 publications · 33 citations
1
h-index
1 publications · 77 citations
1
h-index
Conference · 1 publications · 12 citations
1
h-index
Repository · 1 publications · 13 citations
1
h-index
1 publications · 23 citations
1
h-index
1–5