Jtag Test Access

JTAG Test Access is a standardized hardware-level interface mechanism that enables direct access to integrated circuits for testing, debugging, and programming purposes through a serial communication protocol defined by the IEEE 1149.1 standard.

20

Publications

516

Citations

57

Authors

31

Institutions

Publications per year

2017–2026

3

Variants

Ieee 1149.1Joint Test Action Group Test Access

Authors

57

  1. EL
    Erik Larsson

    Linköping University, Sweden

    3 publications · 98 citations

    3

    h-index

  2. FG
    Farrokh Ghani Zadegan

    Lund University, Sweden

    3 publications · 98 citations

    3

    h-index

  3. VG
    Vítor Grade Tavares

    Universidade do Porto, Portugal

    2 publications · 25 citations

    2

    h-index

  4. UI
    Urban Ingelsson

    Linköping University, Sweden

    2 publications · 87 citations

    2

    h-index

  5. SB
    Swarup Bhunia

    Case Western Reserve University, United States

    2 publications · 102 citations

    2

    h-index

1–5 of 57

Venues

  1. 1

    h-index

  2. IEEE Design and Test

    1 publications · 77 citations

    1

    h-index

  3. 1

    h-index

  4. 1

    h-index

  5. IEEE Design & Test of Computers

    1 publications · 23 citations

    1

    h-index

1–5