Image-based Defect Classification
Image-Based Defect Classification is a methodological framework within defect classification that utilizes visual data representations as primary inputs to identify, categorize, and localize anomalies or faults in materials, products, or systems through computational image analysis techniques.
683
Publications
32.7K
Citations
2.4K
Authors
748
Institutions
Publications per year
2017–2026
453
Parents
683
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2.4K
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748

Zhejiang University
Hangzhou, China
16 h-index
57 publications
6K citations

Northeastern University
Shenyang, China
11 h-index
37 publications
2K citations

Huazhong University of Science and Technology
Wuhan, China
10 h-index
48 publications
1.4K citations

Xi'an Jiaotong University
Xi'an, China
9 h-index
38 publications
1.5K citations
National Taiwan University of Science and Technology
Taipei, Taiwan
9 h-index
23 publications
652 citations

Chongqing University
Chongqing, China
8 h-index
21 publications
826 citations
National Tsing Hua University
Hsinchu, Taiwan
8 h-index
17 publications
442 citations
Yuan Ze University
Taoyuan District, Taiwan
8 h-index
16 publications
936 citations
1–8 of 748
18 publications · 683 citations
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18 publications · 846 citations
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18 publications · 1.1K citations
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14 publications · 927 citations
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14 publications · 663 citations
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