Hysteresis Characterization

Hysteresis Characterization is a device characterization method that identifies and quantifies the dependence of a system's output on the history of its input, particularly the non-overlapping forward and reverse response paths observed during cyclic variations in the input signal.

237

Publications

9.7K

Citations

1.1K

Authors

406

Institutions

Publications per year

2017–2026

54

Authors

1.1K

  1. GW
    Genshui Wang

    Chinese Academy of Sciences, China

    5 publications · 171 citations

    5

    h-index

  2. YL
    Yongyut Laosiritaworn

    Chiang Mai University, Thailand

    4 publications · 117 citations

    4

    h-index

  3. RY
    Rattikorn Yimnirun

    Chiang Mai University, Thailand

    4 publications · 117 citations

    4

    h-index

  4. SA
    Supon Ananta

    Chiang Mai University, Thailand

    4 publications · 117 citations

    4

    h-index

  5. GD
    Gang Du

    Peking University, China

    3 publications · 184 citations

    3

    h-index

1–5 of 1.1K

Venues

  1. Journal of Applied Physics

    16 publications · 578 citations

    13

    h-index

  2. IEEE Transactions on Magnetics

    11 publications · 309 citations

    10

    h-index

  3. 8

    h-index

  4. Applied Physics Letters

    6 publications · 335 citations

    6

    h-index

  5. Journal of Magnetism and Magnetic Materials

    5 publications · 212 citations

    5

    h-index

1–5