Hysteresis Characterization
Hysteresis Characterization is a device characterization method that identifies and quantifies the dependence of a system's output on the history of its input, particularly the non-overlapping forward and reverse response paths observed during cyclic variations in the input signal.
237
Publications
9.7K
Citations
1.1K
Authors
406
Institutions
Publications per year
2017–2026
54
Parents
237
Hysteresis of Electronic Transport in Graphene Transistors
Haomin Wang, Yihong Wu, Chunxiao Cong et al. · ACS Nano · 2010 · 630 citations · Full text
Natural Sciences, Electrical Engineering, Materials Science +17
Y. Wu, Elif Ertekin, Hüseyin Şehitoğlu · Acta Materialia · 2017 · 287 citations
Natural Sciences, Materials Engineering, Materials Science +15
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Chinese Academy of Sciences
Beijing, China
9 h-index
67 publications
2.3K citations

Centre National de la Recherche Scientifique
Paris, France
7 h-index
20 publications
564 citations
Shanghai Institute of Ceramics
Shanghai, China
5 h-index
34 publications
1.1K citations

Chiang Mai University
Chiang Mai, Thailand
4 h-index
19 publications
580 citations

University of Groningen
Groningen, The Netherlands
4 h-index
12 publications
216 citations

Southeast University
Nanjing, China
3 h-index
19 publications
416 citations
Nanjing University
Nanjing, China
3 h-index
14 publications
605 citations
National Yunlin University of Science and Technology
Douliu, Taiwan
3 h-index
5 publications
388 citations
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16 publications · 578 citations
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11 publications · 309 citations
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8 publications · 170 citations
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6 publications · 335 citations
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5 publications · 212 citations
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