Electrical Fast Transient Testing

Electrical Fast Transient Testing is a standardized electromagnetic compatibility test method that distinguishes itself by evaluating the immunity of electrical and electronic equipment to rapid, short-duration voltage transients typically caused by switching events in power and signal lines.

36

Publications

1.1K

Citations

122

Authors

46

Institutions

Publications per year

2017–2026

5

Authors

122

  1. MK
    Ming‐Dou Ker

    National Yang Ming Chiao Tung University, Taiwan

    5 publications · 106 citations

    5

    h-index

  2. CY
    Cheng-Cheng Yen

    National Yang Ming Chiao Tung University, Taiwan

    3 publications · 56 citations

    3

    h-index

  3. DP
    David Pommerenke

    Missouri University of Science and Technology, United States

    3 publications · 85 citations

    3

    h-index

  4. RD
    R. De Leo

    Ospedali Riuniti di Ancona, Italy

    2 publications · 41 citations

    2

    h-index

  5. AC
    Abhijit Chatterjee

    Georgia Institute of Technology, United States

    2 publications · 299 citations

    2

    h-index

1–5 of 122

Venues

  1. 9

    h-index

  2. IEEE Transactions on Power Delivery

    3 publications · 164 citations

    3

    h-index

  3. IEEE Transactions on Electron Devices

    2 publications · 31 citations

    2

    h-index

  4. IEEE Transactions on Industrial Electronics

    2 publications · 33 citations

    2

    h-index

  5. Microelectronics Reliability

    1 publications · 36 citations

    1

    h-index

1–5