Detector Correction
Detector Correction is a computational method in cryo-electron microscopy that constitutes a post-processing technique designed to compensate for systematic measurement errors introduced by the electron detector, thereby enhancing the accuracy of recorded image data.
96
Publications
3.7K
Citations
555
Authors
220
Institutions
Publications per year
2017–2026
17
Parents
96
J. Massey · IRE Transactions on Communications Systems · 1972 · 317 citations
Engineering, Computer Engineering, Electrical Engineering +14
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555
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The University of Texas MD Anderson Cancer Center, United States
2 publications · 223 citations
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1–5 of 555
220

Lawrence Berkeley National Laboratory
Berkeley, United States
5 h-index
17 publications
722 citations
Goddard Space Flight Center
Greenbelt, United States
5 h-index
7 publications
227 citations
University of California, Berkeley
Berkeley, United States
4 h-index
14 publications
765 citations

Uppsala University
Uppsala, Sweden
3 h-index
11 publications
523 citations
Argonne National Laboratory
Lemont, United States
3 h-index
18 publications
270 citations
The University of Tokyo
Tokyo, Japan
3 h-index
4 publications
233 citations
Universitat Politècnica de València
Valencia, Spain
2 h-index
9 publications
241 citations
California Institute of Technology
Pasadena, United States
2 h-index
3 publications
167 citations
1–8 of 220
11 publications · 727 citations
11
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6 publications · 274 citations
6
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5 publications · 119 citations
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4 publications · 100 citations
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3 publications · 74 citations
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