Convergent Beam Electron Diffraction

Convergent Beam Electron Diffraction is a transmission electron microscopy technique in which a focused, convergent beam of electrons is directed onto a crystalline specimen to produce diffraction patterns containing detailed information on crystal symmetry, lattice parameters, and local structure with high spatial resolution.

503

Publications

20.9K

Citations

1.3K

Authors

355

Institutions

Publications per year

2017–2026

27

Variants

Cbed

Authors

1.3K

  1. MT
    Michiyoshi Tanaka

    Tohoku University, Japan

    36 publications · 1.8K citations

    25

    h-index

  2. KT
    Kenji Tsuda

    Tohoku University, Japan

    34 publications · 1.4K citations

    20

    h-index

  3. JZ
    Jian‐Min Zuo

    University of Illinois Urbana-Champaign, United States

    24 publications · 872 citations

    18

    h-index

  4. DC
    D. Cherns

    University of Bristol, United Kingdom

    13 publications · 601 citations

    12

    h-index

  5. JC
    John C. H. Spence

    Arizona State University, United States

    10 publications · 474 citations

    10

    h-index

1–5 of 1.3K

Venues

  1. Applied Physics Letters

    63 publications · 4K citations

    31

    h-index

  2. 22

    h-index

  3. 22

    h-index

  4. Ultramicroscopy

    35 publications · 1.3K citations

    19

    h-index

  5. Journal of Applied Physics

    25 publications · 789 citations

    16

    h-index

1–5