Carrier Concentration Control

Carrier Concentration Control is a materials engineering methodology that regulates the density of free charge carriers in a semiconductor or transparent conducting oxide through intentional doping, defect engineering, or external stimulation to tailor electrical and optical properties.

601

Publications

37.5K

Citations

3.3K

Authors

772

Institutions

Publications per year

2017–2026

249

Authors

3.3K

  1. GJ
    G. Jeffrey Snyder

    Northwestern University, United States

    12 publications · 2.4K citations

    12

    h-index

  2. CU
    Ctirad Uher

    University of Michigan, United States

    6 publications · 444 citations

    6

    h-index

  3. YP
    Yanzhong Pei

    Tongji University, China

    6 publications · 1.5K citations

    6

    h-index

  4. ZC
    Zhi‐Gang Chen

    The University of Queensland, Australia

    5 publications · 150 citations

    5

    h-index

  5. TZ
    Tiejun Zhu

    Zhejiang University, China

    5 publications · 488 citations

    5

    h-index

1–5 of 3.3K

Venues

  1. Applied Physics Letters

    72 publications · 4.7K citations

    32

    h-index

  2. Journal of Applied Physics

    37 publications · 1.6K citations

    25

    h-index

  3. ACS Applied Materials & Interfaces

    26 publications · 1.1K citations

    20

    h-index

  4. Advanced Materials

    19 publications · 2.1K citations

    18

    h-index

  5. Japanese Journal of Applied Physics

    JJAP · 27 publications · 1.6K citations

    16

    h-index

1–5