Built-in Test Systems

Built-In Test Systems is a diagnostic framework embedded within avionics and aircraft electrical systems that enables autonomous fault detection, isolation, and reporting through integrated test logic and real-time monitoring capabilities.

207

Publications

6.9K

Citations

725

Authors

245

Institutions

Publications per year

2017–2026

18

Authors

725

  1. AC
    Abhijit Chatterjee

    Georgia Institute of Technology, United States

    8 publications · 333 citations

    8

    h-index

  2. JA
    Jacob A. Abraham

    The University of Texas at Austin, United States

    6 publications · 196 citations

    6

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  3. EJ
    Erik Jan Marinissen

    IMEC, Belgium

    6 publications · 303 citations

    6

    h-index

  4. SM
    Salvador Mir

    Techniques of Informatics and Microelectronics for Integrated Systems Architecture, France

    5 publications · 116 citations

    5

    h-index

  5. HS
    Haralampos‐G. Stratigopoulos

    Centre National de la Recherche Scientifique, France

    5 publications · 116 citations

    5

    h-index

1–5 of 725

Venues

  1. IEEE Design & Test of Computers

    7 publications · 123 citations

    7

    h-index

  2. 5

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  3. IEEE Transactions on Computers

    4 publications · 596 citations

    4

    h-index

  4. Fusion Engineering and Design

    4 publications · 96 citations

    4

    h-index

  5. 4

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1–5