Aperture Jitter Analysis
Aperture Jitter Analysis is a methodological framework within mixed-signal integrated circuit design that quantifies the timing uncertainty in analog-to-digital conversion caused by variations in the sampling instant, distinguishing it from other jitter analysis techniques through its focus on the aperture phase of the sampling process.
11
Publications
521
Citations
19
Authors
11
Institutions
Publications per year
2017–2026
1
11
Photonic analog-to-digital conversion
Choice Reviews Online · 2001 · 89 citations
Analog-to-digital converter technology comparison
R.H. Walden · 2005 · 51 citations
1–5 of 11
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1–5 of 19
11
Gunma University
Maebashi, Japan
3 h-index
6 publications
174 citations

Kiryu University
Midori, Japan
3 h-index
6 publications
174 citations
HRL Laboratories (United States)
Malibu, United States
2 h-index
2 publications
194 citations
Terumo (Japan)
Tokyo, Japan
2 h-index
2 publications
62 citations
Infineon Technologies (Austria)
Villach, Austria
1 h-index
3 publications
348 citations
The Aerospace Corporation
El Segundo, United States
1 h-index
1 publications
19 citations
Infineon Technologies (Germany)
Munich, Germany
1 h-index
1 publications
116 citations

UNSW Sydney
Sydney, Australia
1 h-index
1 publications
10 citations
1–8 of 11
1 publications · 29 citations
1
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JGPS · 1 publications · 10 citations
1
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1 publications · 22 citations
1
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1 publications · 143 citations
1
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1 publications · 116 citations
1
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1–5