Aging Fault Models
Aging Fault Models is a type of fault model in electronic systems that specifically characterizes defects arising from long-term degradation mechanisms, such as electromigration, hot carrier injection, and time-dependent dielectric breakdown, thereby distinguishing it from transient or manufacturing-related fault models by focusing on performance deterioration over time.
16
Publications
584
Citations
61
Authors
34
Institutions
Publications per year
2017–2026
7
Parents
16
Khac Tuan Huynh, Inma T. Castro, Anne Barros et al. · European Journal of Operational Research · 2011 · 186 citations
Engineering, Industrial Engineering, Systems Engineering +16
Modeling aging effects of IGBTs in power drives by ringing characterization
Antonio Ginart, Michael Roemer, Patrick W. Kalgren et al. · 2008 · 45 citations
1–5 of 16
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Centre National de la Recherche Scientifique, France
2 publications · 200 citations
2
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1
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1
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1–5 of 61
34
Karlsruhe Institute of Technology
Karlsruhe, Germany
2 h-index
5 publications
170 citations

Centre National de la Recherche Scientifique
Paris, France
2 h-index
6 publications
600 citations
GIPSA-Lab
Grenoble, France
2 h-index
4 publications
228 citations
Institut polytechnique de Grenoble
Grenoble, France
2 h-index
4 publications
228 citations

Université Grenoble Alpes
Saint-Martin-d'Hères, France
2 h-index
7 publications
270 citations

Universitat Autònoma de Barcelona
Cerdanyola del Vallès, Spain
2 h-index
5 publications
92 citations
Wuhan University
Wuhan, China
1 h-index
3 publications
84 citations
Gdynia Maritime University
Gdynia, Poland
1 h-index
2 publications
92 citations
1–8 of 34
2 publications · 95 citations
2
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1 publications · 14 citations
1
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1 publications · 25 citations
1
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1 publications · 37 citations
1
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1 publications · 14 citations
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