Aging Fault Models

Aging Fault Models is a type of fault model in electronic systems that specifically characterizes defects arising from long-term degradation mechanisms, such as electromigration, hot carrier injection, and time-dependent dielectric breakdown, thereby distinguishing it from transient or manufacturing-related fault models by focusing on performance deterioration over time.

16

Publications

584

Citations

61

Authors

34

Institutions

Publications per year

2017–2026

7

Authors

61

  1. JM
    J. Martín-Martínez

    Universitat Autònoma de Barcelona, Spain

    2 publications · 47 citations

    2

    h-index

  2. JH
    Jörg Henkel

    Karlsruhe Institute of Technology, Germany

    2 publications · 69 citations

    2

    h-index

  3. CB
    Christophe Bérenguer

    Centre National de la Recherche Scientifique, France

    2 publications · 200 citations

    2

    h-index

  4. DE
    David Egan

    University of Valley Forge, United States

    1 publications · 18 citations

    1

    h-index

  5. ER
    E. Roca

    Instituto de Microelectrónica de Sevilla, Spain

    1 publications · 15 citations

    1

    h-index

1–5 of 61

Venues

  1. Reliability Engineering & System Safety

    2 publications · 95 citations

    2

    h-index

  2. Fuel Cells

    1 publications · 14 citations

    1

    h-index

  3. 1

    h-index

  4. IEEE Transactions on Electron Devices

    1 publications · 37 citations

    1

    h-index

  5. Tectonophysics

    1 publications · 14 citations

    1

    h-index

1–5