Wen-Li Sung

Characteristics of Stacked Gate-All-Around Si Nanosheet MOSFETs With Metal Sidewall Source/Drain and Their Impacts on CMOS Circuit Properties

Wen-Li Sung, Yiming Li · IEEE Transactions on Electron Devices · 2021 · 56 citations

Semiconductors, Device Modeling, Electrical Engineering +15

DC/AC/RF Characteristic Fluctuations Induced by Various Random Discrete Dopants of Gate-All-Around Silicon Nanowire n-MOSFETs

Wen-Li Sung, Yiming Li · IEEE Transactions on Electron Devices · 2018 · 24 citations

Engineering, High-frequency Characteristic Fluctuations, Integrated Circuits +16

Deep Learning Approach to Inverse Grain Pattern of Nanosized Metal Gate for Multichannel Gate-All-Around Silicon Nanosheet MOSFETs

Chandni Akbar, Yiming Li, Wen-Li Sung · IEEE Transactions on Semiconductor Manufacturing · 2021 · 23 citations

Engineering, Neural Networks (Machine Learning), Computational Nanostructure Modeling +17

Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs

Chandni Akbar, Yiming Li, Wen-Li Sung · IEEE Access · 2021 · 22 citations · Full text

Convolutional Neural Network, Engineering, Machine Learning +20

Significance of Work Function Fluctuations in SiGe/Si Hetero-Nanosheet Tunnel-FET at Sub-3 nm Nodes

Narasimhulu Thoti, Yiming Li, Wen-Li Sung · IEEE Transactions on Electron Devices · 2021 · 21 citations

Engineering, Work Function Fluctuations, Silicon On Insulator +19